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Concentrations of Al, Si, Ca, Ti, and Fe were determined by thin-film x-ray primary and secondary emission spectrometry [Feely et al., 1991; Feely et al., 1998]. Submicron samples were collected on Teflo filters (1.0 um pore size) mounted in a Berner impactor downstream of a D50,aero 1.1 um jet plate (Berner et al., 1979). Bulk samples were collected on Teflo filters (1.0 um pore size) in a filter pack having an upper D50,aero of 10 um. Supermicron elemental concentrations were determined by difference between the submicron and bulk samples. This method of sample collection allows for the sharp size cut of the impactor while collecting a thin film of aerosol necessary for the x-ray analysis. Sampling periods ranged from 6 to 24 hours.
The reported Ca does not include sea salt Ca (as determined from soluble Na concentrations and the ratio of Ca to Na in seawater). Blank levels were determined by loading an impactor or filter pack with a filter but not drawing any air through it. Concentrations are reported as ug/m3 at STP (25C and 1 atm).
Berner et al., Sci. Total Environ., 13, 245 - 261, 1979.
Feely et al., Geophys. Monogr. Ser., vol. 63, AGU, Washington, DC, 251 - 257, 1991.
Feely et al., Deep Sea Res., 45, 2637 - 2664, 1998.
Data can be downloaded in ACF format by following the ASCII link, or in binary netCDF file format by following the netCDF link